发明申请
- 专利标题: AUTOMATIC INSPECTION SYSTEM AND METHOD FOR CONTROLLING AUTOMATIC INSPECTION SYSTEM
-
申请号: US16617663申请日: 2018-04-17
-
公开(公告)号: US20200090424A1公开(公告)日: 2020-03-19
- 发明人: Jumpei HONDA , Takuma NISHIMURA , Hiroshige KASHIWABARA , Hidemasa NAKAI , Yuichi IGARASHI , Ryo NAKANO
- 申请人: Hitachi, Ltd.
- 优先权: JP2017-110157 20170602
- 国际申请: PCT/JP2018/015890 WO 20180417
- 主分类号: G07C5/00
- IPC分类号: G07C5/00 ; H04L12/733
摘要:
An inspection target reading device includes a wireless slave station that performs communication via a wireless network, a measurement unit that measures a state of an inspection target, and an analysis unit that generates measurement data, and transmits the measurement data from the wireless slave station via the wireless network. An automatic inspection system includes a wireless master station that communicates with each inspection target reading device via the wireless network, a data acquisition unit that acquires the measurement data from each inspection target reading device through a wireless master station, a data storage unit that stores the measurement data, a determination condition storage unit that stores determination conditions related to the measurement data, and an inspection unit that outputs predetermined measurement data selected from the stored measurement data and a predetermined determination condition corresponding to the predetermined measurement data among the stored determination conditions in association with each other.
公开/授权文献
信息查询