• 专利标题: BENDING MEASUREMENT APPARATUS, IMAGING APPARATUS, PROJECTION APPARATUS AND PROJECTION IMAGING APPARATUS USING THE SAME, AND BENDING MEASUREMENT METHOD
  • 申请号: US16735332
    申请日: 2020-01-06
  • 公开(公告)号: US20200141768A1
    公开(公告)日: 2020-05-07
  • 发明人: Yoshihito IGUCHI
  • 申请人: OLYMPUS CORPORATION
  • 申请人地址: JP Tokyo
  • 专利权人: OLYMPUS CORPORATION
  • 当前专利权人: OLYMPUS CORPORATION
  • 当前专利权人地址: JP Tokyo
  • 主分类号: G01D5/353
  • IPC分类号: G01D5/353 G01B11/24
BENDING MEASUREMENT APPARATUS, IMAGING APPARATUS, PROJECTION APPARATUS AND PROJECTION IMAGING APPARATUS USING THE SAME, AND BENDING MEASUREMENT METHOD
摘要:
A bending measurement apparatus includes a first multimode fiber, a wavefront input apparatus, a first wavefront measurement device, and a processor. The wavefront input apparatus inputs a first wavefront to the first multimode fiber as an input wavefront. The first wavefront measurement device measures an output wavefront outputted from the first multimode fiber as a measured wavefront. The processor select correspondence information which corresponds to the measured wavefront. The correspondence information shows a correspondence relationship between the input wavefront and the output wavefront. The processor sets the bending amount corresponding to the selected correspondence information as a current bending amount of the first multimode fiber.
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