- 专利标题: BENDING MEASUREMENT APPARATUS, IMAGING APPARATUS, PROJECTION APPARATUS AND PROJECTION IMAGING APPARATUS USING THE SAME, AND BENDING MEASUREMENT METHOD
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申请号: US16735332申请日: 2020-01-06
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公开(公告)号: US20200141768A1公开(公告)日: 2020-05-07
- 发明人: Yoshihito IGUCHI
- 申请人: OLYMPUS CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: OLYMPUS CORPORATION
- 当前专利权人: OLYMPUS CORPORATION
- 当前专利权人地址: JP Tokyo
- 主分类号: G01D5/353
- IPC分类号: G01D5/353 ; G01B11/24
摘要:
A bending measurement apparatus includes a first multimode fiber, a wavefront input apparatus, a first wavefront measurement device, and a processor. The wavefront input apparatus inputs a first wavefront to the first multimode fiber as an input wavefront. The first wavefront measurement device measures an output wavefront outputted from the first multimode fiber as a measured wavefront. The processor select correspondence information which corresponds to the measured wavefront. The correspondence information shows a correspondence relationship between the input wavefront and the output wavefront. The processor sets the bending amount corresponding to the selected correspondence information as a current bending amount of the first multimode fiber.
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