- 专利标题: SCAN FREQUENCY MODULATION BASED ON MEMORY DENSITY OR BLOCK USAGE
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申请号: US16195743申请日: 2018-11-19
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公开(公告)号: US20200159410A1公开(公告)日: 2020-05-21
- 发明人: Vamsi Pavan Rayaprolu , Sampath K. Ratnam , Harish R. Singidi , Ashutosh Malshe , Kishore Kumar Muchherla
- 申请人: Micron Technology, Inc.
- 主分类号: G06F3/06
- IPC分类号: G06F3/06
摘要:
A region of a memory component is determined to include a type of memory. A frequency to perform an operation on the region of the memory component is determined based on the type of memory. The operation is performed on a memory cell at the region of the memory component at the determined frequency to transition the memory cell from a state associated with an increased error rate for data stored at the memory cell to another state associated with a decreased error rate for the data stored at the memory cell.
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