- 专利标题: APPARATUS FOR DIAGNOSING ANALYSIS AND METHOD THEREFOR
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申请号: US16574054申请日: 2019-09-17
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公开(公告)号: US20200159885A1公开(公告)日: 2020-05-21
- 发明人: Jee Hun PARK , Jae Hyeon PARK , Sang Jin LEE , Hyun Sik KIM
- 申请人: DOOSAN HEAVY INDUSTRIES & CONSTRUCTION CO., LTD.
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@36c8c335
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
An apparatus and method for diagnosing analysis is provided. The apparatus includes an analytic layer to divide a peripheral space of a target component into a plurality of cells and to derive analytic data by performing a numerical analysis iteration according to computational fluid dynamics for the plurality of cells; a model layer to derive an analytic model that simulates the numerical analysis iteration; a predictive layer to derive predictive data by predicting a result of the numerical analysis iteration by using the analytic model; and a diagnostic layer to diagnose an abnormality condition of numerical analysis by comparing the analytic data and predictive data during the numerical analysis iteration performed by the analytic layer. The diagnostic layer includes an early alarm to generate early alarm information by sorting a cell satisfying an early alarm condition; and an abnormality diagnostic device to determine whether the numerical analysis iteration is abnormal.
公开/授权文献
- US11182515B2 Apparatus for diagnosing analysis and method therefor 公开/授权日:2021-11-23
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