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公开(公告)号：US20200159885A1
公开(公告)日：2020-05-21
申请号：US16574054
申请日：2019-09-17
发明人： Jee Hun PARK , Jae Hyeon PARK , Sang Jin LEE , Hyun Sik KIM
IPC分类号： G06F17/50
摘要： An apparatus and method for diagnosing analysis is provided. The apparatus includes an analytic layer to divide a peripheral space of a target component into a plurality of cells and to derive analytic data by performing a numerical analysis iteration according to computational fluid dynamics for the plurality of cells; a model layer to derive an analytic model that simulates the numerical analysis iteration; a predictive layer to derive predictive data by predicting a result of the numerical analysis iteration by using the analytic model; and a diagnostic layer to diagnose an abnormality condition of numerical analysis by comparing the analytic data and predictive data during the numerical analysis iteration performed by the analytic layer. The diagnostic layer includes an early alarm to generate early alarm information by sorting a cell satisfying an early alarm condition; and an abnormality diagnostic device to determine whether the numerical analysis iteration is abnormal.
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2.发明申请公开(公告)号：US20200175121A1
公开(公告)日：2020-06-04
申请号：US16566967
申请日：2019-09-11
发明人： Jae Hyeon PARK , Sang Jin LEE , Hyun Sik KIM , Jee Hun PARK
IPC分类号： G06F17/50
摘要： A system and method for predicting an analytical abnormality are provided. The method for predicting an analytical abnormality may include generating a signal generation model and an analysis model for a design object based on first analysis data, applying a signal generated by the signal generation model to the analysis model based on second analysis data to calculate one or more estimated values, comparing the estimated values and the second analysis data to generate a plurality of early warning information, and determining whether to output an early warning based on whether the plurality of early warning information satisfy a preset condition.
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