Invention Application
- Patent Title: METHOD AND DEVICE FOR MEASURING ANTENNA REFLECTION COEFFICIENT
-
Application No.: US16561579Application Date: 2019-09-05
-
Publication No.: US20200169331A1Publication Date: 2020-05-28
- Inventor: Daeyoung KIM , Youngik CHO
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5ef02777 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@78d4033e
- Main IPC: H04B17/10
- IPC: H04B17/10 ; G01R29/10

Abstract:
A device for measuring a reflection coefficient of an antenna includes processing circuitry configured to extract a first feedback signal and a second feedback signal from a third feedback signal based on first symbol information of a first symbol included in a radio frequency (RF) transmit signal transferred to the antenna, the first feedback signal corresponding to at least a portion of a cyclic prefix portion of the first symbol, the second feedback signal corresponding to at least a portion of a back-end portion of the first symbol, the third feedback signal being generated from a portion of the RF transmit signal provided by a coupler, and compute the reflection coefficient based on the first feedback signal and the second feedback signal.
Public/Granted literature
- US10727958B2 Method and device for measuring antenna reflection coefficient Public/Granted day:2020-07-28
Information query