Invention Application
- Patent Title: GATE ALL AROUND DEVICE AND METHOD OF FORMATION USING ANGLED IONS
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Application No.: US16793683Application Date: 2020-02-18
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Publication No.: US20200185228A1Publication Date: 2020-06-11
- Inventor: Min Gyu Sung , Sony Varghese , Anthony Renau , Morgan Evans , Joseph C. Olson
- Applicant: APPLIED Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED Materials, Inc.
- Current Assignee: APPLIED Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01L21/3065
- IPC: H01L21/3065 ; H01L29/78 ; H01L27/092 ; H01L21/8238 ; H01L29/06 ; H01L21/8234 ; H01L29/423 ; H01L29/66

Abstract:
A method of forming a three-dimensional transistor device. The method may include providing a fin array on a substrate, the fin array comprising a plurality of fin structures, formed from a monocrystalline semiconductor, and disposed subjacent to a hard mask layer. The method may include directing angled ions at the fin array, wherein the angled ions form a non-zero angle of incidence with respect to a perpendicular to a plane of the substrate. The angled ions may etch the plurality of fin structures to form a stack of isolated nanowires, within a given fin structure.
Public/Granted literature
- US10930735B2 Gate all around device and method of formation using angled ions Public/Granted day:2021-02-23
Information query
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