Invention Application
- Patent Title: SAMPLING CIRCUIT AND SAMPLING METHOD
-
Application No.: US16708876Application Date: 2019-12-10
-
Publication No.: US20200186146A1Publication Date: 2020-06-11
- Inventor: Peter Bogner , Herwig Wappis
- Applicant: Infineon Technologies AG
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@31ba50cd
- Main IPC: H03K17/687
- IPC: H03K17/687 ; H03F3/45
Abstract:
Sampling circuits and methods for sampling are provided. In a first operating phase, sampling capacitors are coupled to inputs, and in a second operating phase, to a common-mode signal.
Information query
IPC分类:
