Invention Application
- Patent Title: FEATURE PARAMETER OBTAINING METHOD AND APPARATUS
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Application No.: US16832916Application Date: 2020-03-27
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Publication No.: US20200228422A1Publication Date: 2020-07-16
- Inventor: Weiwei CHONG , Xiaobo WU , Yang XIN
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@56d7fbdf
- Main IPC: H04L12/24
- IPC: H04L12/24

Abstract:
A feature parameter obtaining method and apparatus are disclosed. The method includes: obtaining feature set information from a data analytics network element, where a feature set corresponding to the feature set information includes a first part of feature and a second part of feature; obtaining a first feature parameter of the first part of feature when data corresponds to the first part of feature; sending a request message to at least one second network element, to request a second feature parameter of the second part of feature when the data corresponds to the second part of feature; receiving the second feature parameter from the at least one second network element; and sending, based on the first feature parameter and the second feature parameter, a third feature parameter of the feature set when the data corresponds to the feature set to the data analytics network element.
Public/Granted literature
- US11012323B2 Feature parameter obtaining method and apparatus Public/Granted day:2021-05-18
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