发明申请
- 专利标题: DEPOSITION METHOD
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申请号: US16751440申请日: 2020-01-24
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公开(公告)号: US20200251326A1公开(公告)日: 2020-08-06
- 发明人: Kazumi KUBO , Yutaka TAKAHASHI , Takayuki KARAKAWA
- 申请人: Tokyo Electron Limited
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4fc54ed4
- 主分类号: H01L21/02
- IPC分类号: H01L21/02
摘要:
A deposition method includes forming a nitride film on a surface of a substrate; and performing, after the depositing, plasma purging supplying a noble gas activated as a plasma. The forming of the nitride film includes a) forming adsorption inhibitors on the surface of the substrate, by supplying a chlorine gas activated by a plasma and by causing the activated chlorine gas to be adsorbed on the surface of the substrate; b) causing a raw material gas, containing silicon and chlorine or a metal and chlorine, to be adsorbed on a region in the surface of the substrate on which the adsorption inhibitors are not present, by supplying the raw material gas on the surface of the substrate; and c) depositing the nitride film on the surface of the substrate, by supplying a nitriding gas to cause the raw material gas to be reacted with the nitriding gas.
公开/授权文献
- US11170999B2 Deposition method 公开/授权日:2021-11-09
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