- 专利标题: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
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申请号: US17075729申请日: 2020-10-21
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公开(公告)号: US20210035977A1公开(公告)日: 2021-02-04
- 发明人: Chih-Yi Wang , Tien-Shan Hsu , Cheng-Pu Chiu , Yao-Jhan Wang
- 申请人: UNITED MICROELECTRONICS CORP.
- 申请人地址: TW Hsin-Chu City
- 专利权人: UNITED MICROELECTRONICS CORP.
- 当前专利权人: UNITED MICROELECTRONICS CORP.
- 当前专利权人地址: TW Hsin-Chu City
- 优先权: CN201811557549.5 20181219
- 主分类号: H01L27/092
- IPC分类号: H01L27/092 ; H01L29/78 ; H01L29/06 ; H01L29/66 ; H01L21/308 ; H01L21/8238 ; H01L29/161 ; H01L29/26
摘要:
A semiconductor device is provided in the disclosure, including a substrate, multiple parallel fins protruding from the substrate and isolated by trenches, and a device insulating layer on the trenches between two fins, wherein the trench is provided with a central first trench and two second trenches at both sides of the first trench, and a depth of the first trench is deeper than a depth of the second trench, and the device insulating layer is provided with a top plane, a first trench and a second trench, and the fins protrude from the top plane, and the bottom surface of the second trench is lower than the bottom surface of the first trench.
公开/授权文献
- US11569235B2 Semiconductor device and method of manufacturing the same 公开/授权日:2023-01-31
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