Invention Application
- Patent Title: THIN FILM MANUFACTURING APPARATUS AND THIN FILM MANUFACTURING APPARATUS USING NEURAL NETWORK
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Application No.: US16772281Application Date: 2018-12-18
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Publication No.: US20210073610A1Publication Date: 2021-03-11
- Inventor: Kazutaka KURIKI , Sachiaki TEZUKA , Kouhei TOYOTAKA
- Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Current Assignee: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Priority: JP2017-251057 20171227
- International Application: PCT/IB2018/060211 WO 20181218
- Main IPC: G06N3/02
- IPC: G06N3/02 ; H01L21/02 ; H05H1/46

Abstract:
A thin film manufacturing apparatus capable of forming thin films with high uniformity is provided. A thin film manufacturing apparatus capable of controlling various kinds of set conditions during thin film formation is provided. The thin film manufacturing apparatus includes a treatment chamber, a gas supply means, an evacuation means, an electric power supply means, an arithmetic portion, and a control device; the gas supply means supplies gas into the treatment chamber; the evacuation means adjusts a pressure in the treatment chamber; the electric power supply means applies voltage between electrodes provided in the treatment chamber; the arithmetic portion has a function of performing detection of an abnormal state and inference with the use of a neural network during thin film formation; and the control device controls various kinds of set conditions in accordance with results of the detection and the inference during the thin film formation.
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