- 专利标题: RUNTIME FAULT DETECTION, FAULT LOCATION, AND CIRCUIT RECOVERY IN AN ACCELERATOR DEVICE
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申请号: US17132221申请日: 2020-12-23
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公开(公告)号: US20210117268A1公开(公告)日: 2021-04-22
- 发明人: Patrick Koeberl , Scott Weber , Alpa Trivedi , Steffen Schulz , Sriram Vangal
- 申请人: Intel Corporation
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 主分类号: G06F11/07
- IPC分类号: G06F11/07 ; G06N20/00 ; G06F21/71
摘要:
An apparatus to facilitate runtime fault detection, fault location, and circuit recovery in an accelerator device is disclosed. In one implementation, the accelerator device comprises a sensor network comprising a plurality of sensors; a secure device manager (SDM); and a sensor aggregator communicably coupled to the sensor network and the SDM. In one implementation, the sensor aggregator can receive sensor data from the sensor network; analyze the sensor data to detect a fault condition; determine a spatial location of the fault condition based on the sensor data; and generate an event for the SDM to cause the SDM to mitigate the fault condition.
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