- 专利标题: LOAD STATE DETECTION CIRCUIT AND METHOD
-
申请号: US17204260申请日: 2021-03-17
-
公开(公告)号: US20210199706A1公开(公告)日: 2021-07-01
- 发明人: Yuqun ZENG , Kai WU , Jirong HUO , Le CHU , Yanhui FU , Qiandeng LI
- 申请人: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- 申请人地址: CN Ningde City
- 专利权人: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- 当前专利权人: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- 当前专利权人地址: CN Ningde City
- 优先权: CN201811079845.9 20180917
- 主分类号: G01R31/00
- IPC分类号: G01R31/00 ; H02H1/00
摘要:
Disclosed are a load state detection circuit and method. A microcontroller is connected to a switch unit which is connected between a detecting power supply and a load to be tested. A voltage sampling point is formed at either terminal of the load to be tested, and the voltage sampling circuit is connected between the voltage sampling point and the microcontroller. The voltage sampling circuit is configured to sample a voltage at the voltage sampling point. The microcontroller is configured to connect the load to be tested and the detecting power supply by controlling the switch unit, and determine whether a fault exists in the load to be tested according to a received voltage at the voltage sampling point sampled by the voltage sampling circuit, before connecting the load to be tested with the drive power supply.
公开/授权文献
- US11360136B2 Load state detection circuit and method 公开/授权日:2022-06-14
信息查询