- 专利标题: SEMICONDUCTOR TRANSISTOR AND FABRICATION METHOD THEREOF
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申请号: US16831817申请日: 2020-03-27
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公开(公告)号: US20210242312A1公开(公告)日: 2021-08-05
- 发明人: Sheng-Hsu Liu , Shih-Hsien Huang , WEN YI TAN
- 申请人: United Semiconductor (Xiamen) Co., Ltd.
- 申请人地址: CN Xiamen
- 专利权人: United Semiconductor (Xiamen) Co., Ltd.
- 当前专利权人: United Semiconductor (Xiamen) Co., Ltd.
- 当前专利权人地址: CN Xiamen
- 优先权: CN202010079601.1 20200204
- 主分类号: H01L29/10
- IPC分类号: H01L29/10 ; H01L29/161 ; H01L29/66 ; H01L21/762
摘要:
A semiconductor transistor is formed on a substrate of a first conductivity type. The substrate has a main surface. An ion well of the second conductivity type is disposed in the substrate. A source region and a drain region spaced apart from the source region are disposed within the ion well. The source region and the drain region have the first conductivity type. An epitaxial channel layer of the first conductivity type is grown from the main surface of the substrate and is disposed between the source region and the drain region. A gate is disposed on the epitaxial channel layer. A gate dielectric layer is disposed between gate and the epitaxial channel layer.
公开/授权文献
- US11289575B2 Semiconductor transistor having epitaxial channel layer 公开/授权日:2022-03-29
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