- 专利标题: QUALITY FACTOR ESTIMATION OF AN INDUCTIVE ELEMENT
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申请号: US17461305申请日: 2021-08-30
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公开(公告)号: US20220069627A1公开(公告)日: 2022-03-03
- 发明人: Lionel Cimaz , Antonio Borrello , Simone Ludwig Dalla Stella
- 申请人: STMicroelectronics (Grand Ouest) SAS , STMicroelectronics S.r.l.
- 申请人地址: FR Le Mans; IT Agrate Brianza (MB)
- 专利权人: STMicroelectronics (Grand Ouest) SAS,STMicroelectronics S.r.l.
- 当前专利权人: STMicroelectronics (Grand Ouest) SAS,STMicroelectronics S.r.l.
- 当前专利权人地址: FR Le Mans; IT Agrate Brianza (MB)
- 优先权: EP20305965.4 20200831
- 主分类号: H02J50/12
- IPC分类号: H02J50/12 ; H04B5/00
摘要:
The present disclosure relates to a device comprising an inductive element and a first capacitive element series connected between a first node and a second node, a first MOS transistor connected between the first node and a third node configured to receive a reference potential, the second node being coupled directly or via a second MOS transistor to the third node, a second capacitive element connected between a fourth node and an interconnection node between the first capacitive element and the inductive element, a current generator configured to provide an AC current to the fourth node, and a switch connected between the fourth node and the third node.
公开/授权文献
- US11588353B2 Quality factor estimation of an inductive element 公开/授权日:2023-02-21
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