Disclosed are apparatuses and related methods for fabrication. The apparatus includes a field-effect transistor (FET). The FET has a source contact coupled to a source implant in a body layer, a drain contact coupled to a drain implant in the body layer, and a first gate coupled to a transistor channel in the body layer between the source contact and the drain contact. The FET further includes a second gate coupled to the body layer between the source contact and the drain contact, a drift region in the body layer, where the second gate at least partially overlaps the drift region, and a resurf portion disposed partially over the first gate and over the second gate.