Invention Application
- Patent Title: MAGNETIC SENSOR AND INSPECTION DEVICE
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Application No.: US17395623Application Date: 2021-08-06
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Publication No.: US20220120830A1Publication Date: 2022-04-21
- Inventor: Hitoshi IWASAKI , Satoshi SHIROTORI , Akira KIKITSU , Yoshihiro HIGASHI
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Priority: JP2020-174624 20201016
- Main IPC: G01R33/09
- IPC: G01R33/09 ; G01R15/20

Abstract:
According to one embodiment of the invention, a magnetic sensor includes a first element part. The first element part includes a first magnetic element, first and s second structures, a first magnetic member, and a second magnetic member. A direction from the first magnetic layer toward the first counter magnetic layer is along a first direction. The first structure includes a first side magnetic layer. The second structure includes a second side magnetic layer. The first magnetic element is between the first structure and the second structure in a second direction crossing the first direction. The first magnetic element is separated from the first side magnetic layer and the second side magnetic layer. A direction from the first side magnetic layer toward the first magnetic member is along the first direction. A direction from the second side magnetic layer toward the second magnetic member is along the first direction.
Public/Granted literature
- US11493571B2 Magnetic sensor and inspection device Public/Granted day:2022-11-08
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