- 专利标题: OTDR measurement via wavelength/frequency sweeping in phase-sensitive DAS/DVS systems
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申请号: US17496678申请日: 2021-10-07
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公开(公告)号: US20220128383A1公开(公告)日: 2022-04-28
- 发明人: Yue-Kai Huang , Ezra lp
- 申请人: NEC Laboratories America, Inc.
- 申请人地址: US NJ Princeton
- 专利权人: NEC Laboratories America, Inc.
- 当前专利权人: NEC Laboratories America, Inc.
- 当前专利权人地址: US NJ Princeton
- 主分类号: G01D5/353
- IPC分类号: G01D5/353
摘要:
Aspects of the present disclosure describe DAS/DVS DFOS systems, methods, and structures that advantageously enable/provide OTDR measurement(s).