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公开(公告)号:US20220128383A1
公开(公告)日:2022-04-28
申请号:US17496678
申请日:2021-10-07
Applicant: NEC Laboratories America, Inc.
Inventor: Yue-Kai Huang , Ezra lp
IPC: G01D5/353
Abstract: Aspects of the present disclosure describe DAS/DVS DFOS systems, methods, and structures that advantageously enable/provide OTDR measurement(s).