Invention Application
- Patent Title: CONCENTRATION MEASUREMENT DEVICE
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Application No.: US17434963Application Date: 2020-03-17
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Publication No.: US20220136988A1Publication Date: 2022-05-05
- Inventor: Susumu KAMIYAMA , Hajime KANO , Shinya NAKAGAWA , Hideyuki NAKAO , Kenichi HANDA , Takashi KASAI
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto-shi, KYOTO
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto-shi, KYOTO
- Priority: JP2019-051263 20190319
- International Application: PCT/JP2020/011702 WO 20200317
- Main IPC: G01N25/18
- IPC: G01N25/18 ; G01N27/18

Abstract:
It is possible to reduce a decrease in accuracy of measuring the concentration of a measurement target gas even in a case where, in a mixture of gases, there is a gas greatly different from another gas in a rate of change in thermal conductivity with respect to temperature. The concentration measurement device includes a sensor configured to measure the concentration of a measurement target gas in a mixture of gases on the basis of thermal conductivity of the measurement target gas, the mixture of gases including two or more components, and a heating unit configured to heat the mixture of gases so that the concentration of the measurement target gas can be uniquely determined with respect to the thermal conductivity.
Public/Granted literature
- US11994481B2 Concentration measurement device Public/Granted day:2024-05-28
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