• Patent Title: X-RAY REFERENCE OBJECT, X-RAY DETECTOR, ADDITIVE MANUFACTURING APPARATUS AND METHOD FOR CALIBRATING THE SAME
  • Application No.: US17416209
    Application Date: 2019-03-01
  • Publication No.: US20220143709A1
    Publication Date: 2022-05-12
  • Inventor: Christian EKBERG
  • Applicant: Arcam AB
  • Applicant Address: SE Mölnlycke
  • Assignee: Arcam AB
  • Current Assignee: Arcam AB
  • Current Assignee Address: SE Mölnlycke
  • International Application: PCT/EP2019/055166 WO 20190301
  • Main IPC: B22F12/90
  • IPC: B22F12/90 H01J37/305 H01J37/30 B22F10/80 B22F12/41
X-RAY REFERENCE OBJECT, X-RAY DETECTOR, ADDITIVE MANUFACTURING APPARATUS AND METHOD FOR CALIBRATING THE SAME
Abstract:
The present specification relates to an additive manufacturing apparatus comprising an X-ray reference object (18) for calibrating an electron beam unit in the additive manufacturing apparatus by detecting X-rays generated by sweeping an electron beam from the electron beam unit over a reference surface (19) of the X-ray reference object (18) and processing the detected signals, the X-ray reference object (18) comprising a support body (20) that has a top surface (21) and comprises a plurality of holes (22) in the top surface (21), The X-ray reference object (18) comprises a plurality of target members (23) inserted into the plurality of holes (22) of the support body (20). The present specification also relates to an X-ray detector to be used in the additive manufacturing apparatus, and to a method for calibrating such an additive manufacturing apparatus.
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