Invention Application
- Patent Title: SURFACE ABNORMALITY DETECTION DEVICE AND SYSTEM
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Application No.: US17599757Application Date: 2020-03-17
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Publication No.: US20220156914A1Publication Date: 2022-05-19
- Inventor: Yoshimasa ONO , Akira TSUJI , Hidemi NOGUCHI , Junichi ABE
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JPCPT/JP2019/014790 20190403
- International Application: PCT/JP2020/011759 WO 20200317
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06V10/764 ; G06T7/70 ; G01B11/30 ; G01S17/89

Abstract:
There is provided a surface abnormality detection device, and a system, capable of detecting an abnormal portion having a displacement below the distance measurement accuracy when detecting the abnormal portion on the surface of a structure. A surface abnormality detection device includes a classification means for classifying an object under measurement into one or more clusters having the same structure, based on position information at a plurality of points on a surface of the object under measurement; a determination means for determining a reflection brightness normal value of the cluster based on a distribution of reflection brightness values at a plurality of points on a surface of the cluster; and an identification means for identifying an abnormal portion on the surface of the cluster based on a difference between the reflection brightness normal value and the reflection brightness value at each of the plurality of points.
Public/Granted literature
- US12154258B2 Surface abnormality detection device and system Public/Granted day:2024-11-26
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