Invention Application
- Patent Title: ELECTRON MICROSCOPY GRID
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Application No.: US17431849Application Date: 2020-02-25
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Publication No.: US20220157559A1Publication Date: 2022-05-19
- Inventor: Wouter VAN PUTTE , Jean-Pierre TIMMERMANS , Jan VANFLETEREN
- Applicant: UNIVERSITEIT ANTWERPEN , IMEC VZW , UNIVERSITEIT GENT
- Applicant Address: BE Antwerpen; BE Leuven; BE Gent
- Assignee: UNIVERSITEIT ANTWERPEN,IMEC VZW,UNIVERSITEIT GENT
- Current Assignee: UNIVERSITEIT ANTWERPEN,IMEC VZW,UNIVERSITEIT GENT
- Current Assignee Address: BE Antwerpen; BE Leuven; BE Gent
- Priority: EP19158982.9 20190225
- International Application: PCT/EP2020/054930 WO 20200225
- Main IPC: H01J37/26
- IPC: H01J37/26 ; B01J19/00

Abstract:
An electron microscopy grid, includes: (i) a perforated substrate, (ii) a support film on the perforated substrate, the support film having a thickness of 60 Å or less, and (iii) linkers attached on top of the support film. The linkers has at least one affinity group for immobilizing an analyte; wherein the linkers form a non-random pattern on the support film.
Public/Granted literature
- US12125668B2 Electron microscopy grid Public/Granted day:2024-10-22
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