Invention Application
- Patent Title: Method for Controlling a Lithographic System
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Application No.: US17441168Application Date: 2020-02-20
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Publication No.: US20220163895A1Publication Date: 2022-05-26
- Inventor: Oscar Franciscus Jozephus NOORDMAN , Antonius Theodorus Wilhelmu KEMPEN , Jan Bernard Plechelmus VAN SCHOOT , Marinus Aart VAN DEN BRINK
- Applicant: ASML Netherlands B,V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B,V.
- Current Assignee: ASML Netherlands B,V.
- Current Assignee Address: NL Veldhoven
- Priority: EP19164206.5 20190321
- International Application: PCT/EP2020/054446 WO 20200220
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
A lithographic system comprises a radiation source and a lithographic apparatus. The radiation source provides radiation to the lithographic apparatus. The lithographic apparatus uses the radiation for imaging a pattern onto multiple target areas on a layer of photo-resist on a semiconductor substrate. The imaging requires a pre-determined dose of radiation. The system is controlled so as to set a level of a power of the radiation in dependence on a magnitude of the pre-determined dose.
Public/Granted literature
- US12099306B2 Method for controlling a lithographic system Public/Granted day:2024-09-24
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