Invention Application
- Patent Title: DISPLAY DEVICE AND METHOD FOR INSPECTING DEFECT OF DISPLAY DEVICE
-
Application No.: US17462705Application Date: 2021-08-31
-
Publication No.: US20220173172A1Publication Date: 2022-06-02
- Inventor: SEUNGHYUN PARK , YUN-MO CHUNG
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-Si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-Si
- Priority: KR10-2020-0162198 20201127
- Main IPC: H01L27/32
- IPC: H01L27/32 ; H01L51/52 ; H01L51/56 ; G01R31/28

Abstract:
A display device includes a substrate including a display area and a test area adjacent to the display area, a lower electrode disposed in the display area on the substrate, a common layer disposed on the lower electrode, an upper electrode disposed on the common layer; and a test element group. The test element group includes a plurality of electrode patterns disposed in a same layer as the lower electrode and in the test area on the substrate, a test common layer disposed in a same layer as the common layer and on the electrode patterns, where a plurality of openings is defined through the test common layer to expose a part of each of the electrode patterns, and an electrode layer disposed in a same layer as the upper electrode, on the test common layer, and in contact with the electrode patterns through the openings.
Public/Granted literature
- US11910692B2 Display device including test element group, and method for inspecting defect of display device Public/Granted day:2024-02-20
Information query
IPC分类: