Invention Application
- Patent Title: CALIBRATION DEVICE AND CALIBRATION METHOD
-
Application No.: US17528582Application Date: 2021-11-17
-
Publication No.: US20220180086A1Publication Date: 2022-06-09
- Inventor: Keiichi MITANI , Kazuyuki TAJIMA , Kazuyoshi YAMAZAKI
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Priority: JP2020-201534 20201204
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/20

Abstract:
A calibration device performs a calibration between a plurality of imaging devices, each of which outputs field-of-view information which is information on a field-of-view of the imaging device itself. The field-of-view information contains a bitmap image and a range image. The calibration device includes: a state estimation part configured to detect, in a field of view of a first imaging device, an image of a second imaging device, and estimate a relative position and a relative attitude of the second imaging device with respect to the first imaging device, based on the detected image; and a transformation information calculation part configured to calculate transformation information between a coordinate system of the first imaging device and a coordinate system of the second imaging device, based on the estimated relative position and relative attitude.
Public/Granted literature
- US11900669B2 Calibration device and calibration method Public/Granted day:2024-02-13
Information query