Invention Application
- Patent Title: SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
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Application No.: US17593071Application Date: 2020-03-04
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Publication No.: US20220189779A1Publication Date: 2022-06-16
- Inventor: Tsuyoshi TAKAHASHI , Yu NUNOSHIGE
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JP2019-046346 20190313
- International Application: PCT/JP2020/009209 WO 20200304
- Main IPC: H01L21/285
- IPC: H01L21/285 ; H01J37/32 ; C23C16/34 ; C23C16/455 ; C23C16/505

Abstract:
Provided are a substrate processing method and a substrate processing apparatus for forming a low-resistance metal-containing nitride film. The substrate processing method includes: a step of providing a substrate in a processing container; a step of forming a metal-containing nitride film on the substrate by repeating supplying an organic metal-containing gas and a nitrogen-containing gas alternately for a first predetermined number of cycles; a step of modifying the metal-containing nitride film by generating plasma in the processing container; and a step of repeating the step of forming the metal-containing nitride film and the step of modifying the metal-containing nitride film for a second predetermined number of cycles.
Public/Granted literature
- US12009217B2 Substrate processing method and substrate processing apparatus Public/Granted day:2024-06-11
Information query
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