Invention Application
- Patent Title: MEMORY DEVICE INCLUDING VOLTAGE CONTROL FOR DIFUSSION REGIONS ASSOCIATED WITH MEMORY BLOCKS
-
Application No.: US17217014Application Date: 2021-03-30
-
Publication No.: US20220208274A1Publication Date: 2022-06-30
- Inventor: Go Shikata , Shigekazu Yamada
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G11C16/16
- IPC: G11C16/16 ; G11C16/30

Abstract:
Some embodiments include apparatuses and methods of operating the apparatuses. One of the apparatuses includes a first memory block including first control gates for respective first memory cells of the first memory block; a second memory block including second control gates for respective second memory cells of the second memory block; first diffusion regions coupled to the first control gates; second diffusion regions adjacent the first diffusion regions, the second diffusion regions coupled to the second control gates; and a circuit to apply a voltage to the second diffusion regions in a write operation performed on the first memory block.
Public/Granted literature
- US11664076B2 Memory device including voltage control for diffusion regions associated with memory blocks Public/Granted day:2023-05-30
Information query