Memory devices might include an array of memory cells and a controller configured to access the array of memory cells. The controller may sense a first threshold voltage of the selected memory cell. In response to the sensed first threshold voltage being between a first pre-program verify level and a first program verify level, the controller may bias the selected memory cell for SSPC programming. The first pre-program verify level might be less than a final pre-program verify level and the first program verify level might be less than a final program verify level. In response to the sensed first threshold voltage being less than the first pre-program verify level, the controller may bias the selected memory cell for non-SSPC programming. In response to the sensed first threshold voltage being greater than the first program verify level, the controller may inhibit programming of the selected memory cell.