Invention Application
- Patent Title: Test Method, Apparatus, And System
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Application No.: US17702181Application Date: 2022-03-23
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Publication No.: US20220216926A1Publication Date: 2022-07-07
- Inventor: Bo HAO , Yecun HUANG , Liang HU , Jutian GUO , Wei ZHAI , Chengwen YAN
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Priority: CN201910901411.0 20190923
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04B17/10 ; H04B17/20 ; H03M1/00

Abstract:
Example test methods and apparatus are described. One example method includes receiving an uplink radio frequency signal by a test device from a terminal device, where the uplink radio frequency signal is generated by superimposing at least two test signals, and each of the at least two test signal corresponds to one communication protocol. The test device extracts the at least two test signals from the uplink radio frequency signal. The test device separately tests the at least two test signals, and obtains an uplink test result of the terminal device.
Public/Granted literature
- US12166533B2 Test method, apparatus, and system Public/Granted day:2024-12-10
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