- 专利标题: TEST SOCKET ASSEMBLY
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申请号: US17614290申请日: 2020-12-24
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公开(公告)号: US20220252639A1公开(公告)日: 2022-08-11
- 发明人: Jong Choen Shin , Dong Ho Ha
- 申请人: Jong Choen Shin , Dong Ho Ha
- 申请人地址: KR Gyeonggi-do; KR Gyeonggi-do
- 专利权人: Jong Choen Shin,Dong Ho Ha
- 当前专利权人: Jong Choen Shin,Dong Ho Ha
- 当前专利权人地址: KR Gyeonggi-do; KR Gyeonggi-do
- 优先权: KR10-2019-0177991 20191230
- 国际申请: PCT/KR2020/019065 WO 20201224
- 主分类号: G01R1/04
- IPC分类号: G01R1/04 ; H01R13/73 ; G01R31/28
摘要:
A test socket assembly which can stably transmit a signal at high communication speed comprises: a test socket having a plurality of conductive parts for electrically connecting a device terminal of the device to be tested and a board terminal of the tester board; a guide housing including a housing body having a housing opening into which the device to be tested can be inserted, and a socket supporting section disposed beneath the housing opening so as to protrude from one surface of the housing body; and a socket frame including a frame body, which is coupled to the test socket so as to be secured to the socket supporting section so that the test socket is supported beneath the housing opening, and a frame wing which is bent from the frame body toward the housing body so as to be secured to the housing body.
公开/授权文献
- US11940462B2 Test socket assembly 公开/授权日:2024-03-26
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