- 专利标题: USER-INTERACTIVE DEFECT ANALYSIS FOR ROOT CAUSE
-
申请号: US17729972申请日: 2022-04-26
-
公开(公告)号: US20220253431A1公开(公告)日: 2022-08-11
- 发明人: Jason Ma , Allen Cai , Andrew Cooper , Arnaud Drizard , Benjamin Lee , Damien Cramard , Damian Rusak , Hind Kraytem , Jan Matas , Ludovic Lay , Myles Scolnick , Radu-Andrei Szasz , Stefan Negrus , Taylor Cathcart , Zhixian Shen
- 申请人: Palantir Technologies Inc.
- 申请人地址: US CA Palo Alto
- 专利权人: Palantir Technologies Inc.
- 当前专利权人: Palantir Technologies Inc.
- 当前专利权人地址: US CA Palo Alto
- 主分类号: G06F16/23
- IPC分类号: G06F16/23 ; G06F3/04847 ; G06F16/215 ; G06F16/25 ; G06F16/22 ; G06F16/9535
摘要:
Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.
公开/授权文献
- US11789931B2 User-interactive defect analysis for root cause 公开/授权日:2023-10-17
信息查询