Invention Application
- Patent Title: METHOD OF FORMING MATERIAL LAYER
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Application No.: US17547626Application Date: 2021-12-10
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Publication No.: US20220254643A1Publication Date: 2022-08-11
- Inventor: Kyung-Eun BYUN , Sangwoo KIM , Minsu SEOL , Hyeonjin SHIN , Minseok SHIN , Pin ZHAO , Taehyeong KIM , Jaehwan JUNG
- Applicant: Samsung Electronics Co., Ltd. , RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Applicant Address: KR Suwon-si; KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee Address: KR Suwon-si; KR Gyeonggi-do
- Priority: KR10-2021-0016843 20210205
- Main IPC: H01L21/308
- IPC: H01L21/308 ; H01J37/34

Abstract:
A method of forming a material film includes providing a non-photosensitive mask on a substrate to expose a partial region of the substrate, forming a material film on the partial region of the substrate using a sputtering process, removing the non-photosensitive mask, and heat-treating the substrate and the material film from which the non-photosensitive mask is removed under a first gas atmosphere. The material film includes a transition metal and a chalcogen element. The sputtering process may include an RF magnetron sputtering process. The heat treatment may be performed at a higher temperature than a temperature of the forming the material film.
Information query
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