- 专利标题: METHOD OF FORMING MATERIAL LAYER
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申请号: US17547626申请日: 2021-12-10
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公开(公告)号: US20220254643A1公开(公告)日: 2022-08-11
- 发明人: Kyung-Eun BYUN , Sangwoo KIM , Minsu SEOL , Hyeonjin SHIN , Minseok SHIN , Pin ZHAO , Taehyeong KIM , Jaehwan JUNG
- 申请人: Samsung Electronics Co., Ltd. , RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- 申请人地址: KR Suwon-si; KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- 当前专利权人: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- 当前专利权人地址: KR Suwon-si; KR Gyeonggi-do
- 优先权: KR10-2021-0016843 20210205
- 主分类号: H01L21/308
- IPC分类号: H01L21/308 ; H01J37/34
摘要:
A method of forming a material film includes providing a non-photosensitive mask on a substrate to expose a partial region of the substrate, forming a material film on the partial region of the substrate using a sputtering process, removing the non-photosensitive mask, and heat-treating the substrate and the material film from which the non-photosensitive mask is removed under a first gas atmosphere. The material film includes a transition metal and a chalcogen element. The sputtering process may include an RF magnetron sputtering process. The heat treatment may be performed at a higher temperature than a temperature of the forming the material film.
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