• Patent Title: SIGNAL ANALYSIS METHOD, AND APPARATUS FOR THREE-PHASE SYSTEM, AND PROGRAM
  • Application No.: US17636424
    Application Date: 2019-08-29
  • Publication No.: US20220283209A1
    Publication Date: 2022-09-08
  • Inventor: Murtuza PETLADWALA
  • Applicant: NEC Corporation
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Minato-ku, Tokyo
  • International Application: PCT/JP2019/033850 WO 20190829
  • Main IPC: G01R25/08
  • IPC: G01R25/08 G01R29/18
SIGNAL ANALYSIS METHOD, AND APPARATUS FOR THREE-PHASE SYSTEM, AND PROGRAM
Abstract:
The present invention provides an apparatus and method enabling to perform a 2-dimensional trajectory analysis applicable for a three-phase system. A signal analysis apparatus generates a three-row and N-column waveform matrix constituted by three N dimensional row vectors having respectively N samples of first to third phase current values obtained from three-phase current signals measured in a three-phase system, where N is the number of samples of each of the three-phase current signals in one cycle of an AC power supply; applies transformation to the waveform matrix to obtain a two-row and N-column matrix constituted by the first and second N dimensional row vectors; performs normalization in amplitude of the first and second N dimensional row vectors, respectively; selects a grid size based on the sample number N; and maps a two dimensional trajectory made up from the first and second normalized N dimensional row vectors on a grid with the grid size selected.
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