Invention Application
- Patent Title: INSPECTION SYSTEM, INSPECTION METHOD, PROGRAM, AND STORAGE MEDIUM
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Application No.: US17827183Application Date: 2022-05-27
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Publication No.: US20220358638A1Publication Date: 2022-11-10
- Inventor: Takanobu OJIMA , Jeffry FERNANDO , Hideto MOTOMURA
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/50 ; G06T7/90 ; G06T7/40 ; H04N5/225 ; H04N5/232 ; H04N5/247 ; G01N21/88 ; G01N21/25

Abstract:
An inspection system includes an acquisition unit and a determination unit. The acquisition unit acquires an image representing a surface of an object. The determination unit performs color determination processing. The color determination processing is performed to determine a color of the surface of the object based on a plurality of conditions of reflection. The plurality of conditions of reflection are obtained from the image representing the surface of the object as acquired by the acquisition unit, and have a specular reflection component and a diffuse reflection component at respectively different ratios on the surface of the object.
Public/Granted literature
- US11727554B2 Inspection system, inspection method, program, and storage medium Public/Granted day:2023-08-15
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