Invention Application
- Patent Title: TECHNIQUES FOR SELECTING A BEAM PAIR USING SINGLE LAYER MEASUREMENTS
-
Application No.: US17320641Application Date: 2021-05-14
-
Publication No.: US20220368399A1Publication Date: 2022-11-17
- Inventor: Yuan GAO , Mihir Vijay LAGHATE , Lorenzo FERRARI , Raghu Narayan CHALLA , Gautham HARIHARAN , Danlu ZHANG , Supratik BHATTACHARJEE
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Main IPC: H04B7/06
- IPC: H04B7/06 ; H04W24/08 ; H04L5/00

Abstract:
Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may receive, from a base station, a single layer reference signal. The UE may perform single layer measurements associated with the single layer reference signal for a plurality of UE beam pairs. The UE may determine, based at least in part on the single layer measurements for the plurality of UE beam pairs, multiple layer measurements associated with one or more UE beam pairs of the plurality of UE beam pairs. The UE may select, from the one or more UE beam pairs, a UE beam pair based at least in part on the multiple layer measurements associated with the one or more UE beam pairs. Numerous other aspects are described.
Information query