Invention Application
- Patent Title: Flow Rate Measurement Device
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Application No.: US17776859Application Date: 2020-10-20
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Publication No.: US20220390264A1Publication Date: 2022-12-08
- Inventor: Takayuki YOGO , Binti Haridan FATIN FARHANAH , Akira UENODAN , Hiroyuki ABE , Mizuki IJUIN
- Applicant: Hitachi Astemo, Ltd.
- Applicant Address: JP Hitachinaka-shi, Ibaraki
- Assignee: Hitachi Astemo, Ltd.
- Current Assignee: Hitachi Astemo, Ltd.
- Current Assignee Address: JP Hitachinaka-shi, Ibaraki
- Priority: JP2019-206013 20191114
- International Application: PCT/JP2020/039326 WO 20201020
- Main IPC: G01F15/16
- IPC: G01F15/16

Abstract:
The objective of the present invention is to obtain a flow rate measurement device capable of reducing variations in the flow rate detection accuracy by suppressing the inclination of a chip package relative to a circuit board. A flow rate measurement device 20 of the present invention includes a chip package 310 having a flow rate sensor 311 and a passage wall 314 formed therein, and a circuit board 300 on which the chip package 310 is mounted, in which the chip package 310 is mounted such that the flow rate sensor 311 faces a portion of the circuit board 300 and a portion of the passage wall 314 as a resin portion of the chip package 310 contacts the circuit board 300.
Public/Granted literature
- US12203793B2 Flow rate measurement device Public/Granted day:2025-01-21
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