- 专利标题: Method of Mass Analysis - SWATH with Orthogonal Fragmentation Methodology
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申请号: US17755597申请日: 2020-09-22
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公开(公告)号: US20230005727A1公开(公告)日: 2023-01-05
- 发明人: Yves Le Blanc
- 申请人: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- 申请人地址: SG Singapore
- 专利权人: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- 当前专利权人: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- 当前专利权人地址: SG Singapore
- 国际申请: PCT/IB2020/058825 WO 20200922
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
In a DIA method, a specified precursor ion m/z range of interest is divided into a set of two or more precursor ion mass selection windows. A tandem mass spectrometer is instructed to select, dissociate using a first dissociation technique, and mass analyze each precursor ion mass selection window of the set within a specified cycle time. Product ion intensity and m/z measurements are produced for each window of the set using the first dissociation technique. The tandem mass spectrometer is also instructed to select, dissociate using a second dissociation technique, and mass analyze each precursor ion mass selection window of the set within the same cycle time. Product ion intensity and m/z measurements are produced for each window of the set using the second dissociation technique. Product ion measurements from both the first and second dissociation techniques are used to identify or quantitate compounds of a sample.
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