A semiconductor package includes a substrate including an upper pad at a top surface of the substrate, a semiconductor chip on the substrate and including a chip pad at a top surface of the semiconductor chip, a connecting structure on the semiconductor chip and including a connecting pad at a top surface of the connecting structure and electrically connected to the upper pad, an encapsulant covering the substrate, the semiconductor chip, and the connecting structure, and a test terminal on the connecting structure and extending through the encapsulant. The connecting structure electrically interconnects the semiconductor chip and the test terminal.