Invention Publication
- Patent Title: DRIVING DEVICE PROVIDED WITH PIEZOELECTRIC ELEMENT DETERIORATION DETECTION CIRCUIT AND DETERIORATION DETECTION METHOD
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Application No.: US17604982Application Date: 2020-04-20
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Publication No.: US20230152263A1Publication Date: 2023-05-18
- Inventor: Atsushi HIDAKA , Katsuyuki SUGITA , Takatoshi NAKATANI , Kouji NISHINO , Nobukazu IKEDA
- Applicant: FUJIKIN INCORPORATED
- Applicant Address: JP Osaka
- Assignee: FUJIKIN INCORPORATED
- Current Assignee: FUJIKIN INCORPORATED
- Current Assignee Address: JP Osaka
- Priority: JP 19084548 2019.04.25
- International Application: PCT/JP2020/016998 2020.04.20
- Date entered country: 2022-04-06
- Main IPC: G01N27/02
- IPC: G01N27/02 ; F16K37/00

Abstract:
To provide a driving device including a piezoelectric element deterioration detection circuit and a deterioration detection method that enable detection of deterioration of the piezoelectric element used in the driving device, without stopping a normal operation of the driving device. The driving device 1 includes a piezoelectric element 2, a power supply unit 3, a first resistor 11, a second resistor 12, a measuring unit and a control unit, wherein resistance values of the first resistor and the second resistor are smaller than an insulating resistance value of the piezoelectric element, the measuring unit measures, a voltage across the first resistor (voltage between a first terminal 13 and a second terminal 14), in a state of supplying a predetermined voltage from the power supply unit, and the control unit 3 calculates a resistance value of the piezoelectric element from a voltage value obtained by the measurement of the measuring unit, and determines, whether or not degradation has occurred in the piezoelectric element based on the calculated resistance value.
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