Invention Publication
- Patent Title: ROTARY KILN BRICK LAYER THERMAL MONITORING SYSTEMS
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Application No.: US18147622Application Date: 2022-12-28
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Publication No.: US20230160636A1Publication Date: 2023-05-25
- Inventor: Mark Israelsen
- Applicant: Quantum IR Technologies, LLC
- Applicant Address: US UT Salt Lake City
- Assignee: Quantum IR Technologies, LLC
- Current Assignee: Quantum IR Technologies, LLC
- Current Assignee Address: US UT Salt Lake City
- Main IPC: F27D21/00
- IPC: F27D21/00 ; G01B11/02 ; H04N23/23 ; G01J5/00 ; G01J5/60 ; G06T17/00 ; G06V10/75

Abstract:
A system for monitoring brick in a rotary kiln includes an infrared sensor and a computing system configured to: obtain a digital model of a brick layer of a rotary kiln having a plurality of bricks, wherein the digital model of the brick layer is based on a measured brick thickness correlated with a measured infrared temperature for each brick; obtain infrared data of the rotary kiln with the at least one infrared imaging sensor; determine the measured infrared temperature for each brick; determine a brick thickness of a first brick in the brick layer of the rotary kiln based on the measured infrared temperature assigned to the first brick with the digital model of the brick layer; and provide the brick thickness of the first brick in a brick thickness report.
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