- 专利标题： APPARATUS AND METHOD FOR HIGH-PERFORMANCE CHARGED PARTICLE DETECTION
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申请号： US17925644申请日： 2021-05-17
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公开(公告)号： US20230170205A1公开(公告)日： 2023-06-01
- 发明人: Hung Quang Hoang , Tom Wirtz , Rathaiah Pureti , Olivier Bouton
- 申请人： LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- 申请人地址： LU Esch-sur-Alzette
- 专利权人： LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- 当前专利权人： LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- 当前专利权人地址： LU Esch-sur-Alzette
- 优先权： LU 101794 2020.05.18
- 国际申请： PCT/EP2021/063007 2021.05.17
- 进入国家日期： 2022-11-16
- 主分类号： H01J49/42
- IPC分类号： H01J49/42 ; H01J49/00 ; H01J49/06
摘要：
A detection apparatus and method for detecting charged particles. The device relies on a detection assembly comprising microchannel plates. The useful surface of the microchannel plate device is maximized in time through the use of beam deflection means upstream of the detection front.
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