- 专利标题: Waveform Emission Location Determination Systems and Associated Methods
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申请号: US17547665申请日: 2021-12-10
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公开(公告)号: US20230184880A1公开(公告)日: 2023-06-15
- 发明人: Michael S. Hughes , Eric G. Gonzalez
- 申请人: Battelle Memorial Institute
- 申请人地址: US WA Richland
- 专利权人: Battelle Memorial Institute
- 当前专利权人: Battelle Memorial Institute
- 当前专利权人地址: US WA Richland
- 主分类号: G01S5/22
- IPC分类号: G01S5/22 ; G08B13/16 ; G10L25/51
摘要:
Waveform emission location determination systems and associated methods are described. According to one aspect, a waveform emission location determination system includes a plurality of detectors configured to receive a waveform emitted by a source and to generate electrical signals corresponding to the waveform, processing circuitry configured to access data corresponding to the electrical signals generated by the detectors, use the data to determine a plurality of spheres, and wherein a surface of each of the spheres contains a location of the source when the waveform was emitted by the source, determine an intersection of the spheres, and use the intersection of the spheres to determine the location of the source when the waveform was emitted by the source.
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