Invention Publication
- Patent Title: EFFICIENT MANAGEMENT OF FAILED MEMORY BLOCKS IN MEMORY SUB-SYSTEMS
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Application No.: US18167992Application Date: 2023-02-13
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Publication No.: US20230195572A1Publication Date: 2023-06-22
- Inventor: Tyler L. Betz , Andrew M. Kowles , Adam J. Hieb
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/07 ; G06F3/06

Abstract:
Disclosed is a system including a memory device having a plurality of physical memory segments and a processing device to perform operations that include, responsive to detecting a failure of a memory operation associated with a physical memory segment of the plurality of physical memory segments, quarantining the physical memory segment, responsive to quarantining the physical memory segment, performing one or more scanning operations on the physical memory segment, and determining, based on results of the one or more scanning operations, a viability status of the physical memory segment, wherein the viability status indicates an ability of the physical memory segment to store data.
Public/Granted literature
- US11914474B2 Efficient management of failed memory blocks in memory sub-systems Public/Granted day:2024-02-27
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