发明公开
- 专利标题: TRANSISTOR STRUCTURES
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申请号: US17647931申请日: 2022-01-13
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公开(公告)号: US20230223412A1公开(公告)日: 2023-07-13
- 发明人: Robert Michael GUIDASH , Muhammad Maksudur RAHMAN
- 申请人: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- 申请人地址: US AZ Phoenix
- 专利权人: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- 当前专利权人: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- 当前专利权人地址: US AZ Phoenix
- 主分类号: H01L27/146
- IPC分类号: H01L27/146 ; H04N5/3745 ; H04N5/355 ; H04N5/378
摘要:
Transistor structures for a transistor may include a first source-drain region, a second source-drain region, and a channel region between the first and second source-drain regions overlapped by a gate structure. Transistor structures may be formed in a well of a first doping type. Isolation structures having the first doping type may be formed within the well. A lightly doped implant region of a second doping type for each of the source-drain regions may be formed within the well and separated from the isolation structures. A heavily doped surface implant region of the first doping type may extend across the surface of the well and cover the lightly doped implant region of each source-drain region. The surface implant region may be formed by patterning or by a blanket implantation process across the transistor structures.
公开/授权文献
- US11881492B2 Transistor structures 公开/授权日:2024-01-23
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