- 专利标题: System for Automatic Structure Footprint Detection from Oblique Imagery
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申请号: US17831656申请日: 2022-06-03
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公开(公告)号: US20230023311A1公开(公告)日: 2023-01-26
- 发明人: Stephen L. Schultz , Yandong Wang
- 申请人: Pictometry International Corp.
- 申请人地址: US NY Rochester
- 专利权人: Pictometry International Corp.
- 当前专利权人: Pictometry International Corp.
- 当前专利权人地址: US NY Rochester
- 主分类号: G06T11/00
- IPC分类号: G06T11/00 ; G01C11/06 ; G06T17/05 ; G06T7/13 ; G06T7/50 ; G06T7/181 ; G06T7/62
摘要:
Systems and methods for structure footprint detection from oblique imagery are disclosed, including a computer system configured to receive geo-referenced oblique images; analyze pixels of the images to: identify pixels representing a structure with walls; determine ground locations for the walls, geographic locations and orientations of pixels representing vertical edges of the walls, and relative lengths of the walls to produce horizontal line segments representing the base of the walls and having a relative length and an orientation, the horizontal line segment(s) determined from horizontal edge(s) extending a length between vertical edges above the bottoms of the vertical edges such that the horizontal edge is above the base of the structure; and assemble the horizontal line segments based on their relative lengths and orientations to form a footprint of the structure.
信息查询
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T11/00 | 2D〔二维〕图像的生成 |