- 专利标题: GROWTH INHIBITOR FOR FORMING THIN FILM, METHOD OF FORMING THIN FILM USING GROWTH INHIBITOR, AND SEMICONDUCTOR SUBSTRATE FABRICATED BY METHOD
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申请号: US18014452申请日: 2021-07-16
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公开(公告)号: US20230257881A1公开(公告)日: 2023-08-17
- 发明人: Chang Bong YEON , Jin Hee KIM , Jae Sun JUNG , Jong Moon KIM , Seung Hyun LEE , Seok Jong LEE
- 申请人: SOULBRAIN CO., LTD.
- 申请人地址: KR Gyeonggi-do
- 专利权人: SOULBRAIN CO., LTD.
- 当前专利权人: SOULBRAIN CO., LTD.
- 当前专利权人地址: KR Gyeonggi-do
- 优先权: KR 20200089035 2020.07.17
- 国际申请: PCT/KR2021/009167 2021.07.16
- 进入国家日期: 2023-01-04
- 主分类号: C23C16/455
- IPC分类号: C23C16/455 ; C23C16/34 ; H01L21/768
摘要:
The present invention relates to a growth inhibitor for forming a thin film, a method of forming a thin film using the growth inhibitor, and a semiconductor substrate fabricated by the method. More particularly, the growth inhibitor for forming a thin film according to the present invention is a compound represented by Chemical Formula 1: AnBmXoYiZj. A is carbon or silicon; B is hydrogen or an alkyl group having 1 to 3 carbon atoms; X is a leaving group having a bond dissociation energy of 50 to 350 KJ/mol; Y and Z independently include one or more selected from the group consisting of oxygen, nitrogen, sulfur, and fluorine and are different from each other; n is an integer from 1 to 15; o is an integer greater than or equal to 1; m is 0 to 2n+1; and i and j are integers from 0 to 3.
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