Invention Publication
- Patent Title: MEASUREMENT SYSTEM INCLUDING REFLECTOR
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Application No.: US18245271Application Date: 2021-09-30
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Publication No.: US20230393054A1Publication Date: 2023-12-07
- Inventor: John A. Wheatley , William Gray , Bharat R. Acharya , Aaron M. Marcella , Stephen M. Kennedy , Brett J. Sitter , Micheal L. Steiner , Mark A. Roehrig , Jonah Shaver , Jessica E. DeMay
- Applicant: 3M INNOVATIVE PROPERTIES COMPANY
- Applicant Address: US MN St. Paul
- Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee Address: US MN St. Paul
- International Application: PCT/IB2021/059009 2021.09.30
- Date entered country: 2023-03-14
- Main IPC: G01N21/03
- IPC: G01N21/03 ; G01N21/25

Abstract:
A measurement system is disclosed and includes a light source, a receiver, a measurement subject, and a reflector. The reflector is disposed on an opposite side of the measurement subject than are the light source and the receiver.
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