Invention Application
- Patent Title: HAMMERING TEST SYSTEM
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Application No.: US17943593Application Date: 2022-09-13
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Publication No.: US20230093886A1Publication Date: 2023-03-30
- Inventor: Takeshi KIKUCHI
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2021-160657 20210930
- Main IPC: G01N3/303
- IPC: G01N3/303

Abstract:
Provided is a hammering test system. A hammering test system includes a hammering test device including a target, a traveling mechanism for automatically traveling on a to-be-tested surface, a marking mechanism configured to perform marking on the to-be-tested surface, an adsorbing mechanism for adsorbing to the to-be-tested surface, and a hammering test mechanism configured to conduct a hammering test on the to-be-tested surface, and a surveying instrument capable of performing automatic tracking and distance and angle measurements of the target. A hammering test is conducted by causing the hammering test device to travel to a desired position while adsorbing to a to-be-tested surface by the adsorbing mechanism. When it is determined that there is an abnormality, a marking is marked on the to-be-tested surface. The surveying instrument automatically tracks the target, and when conducting a hammering test, makes distance and angle measurements of the target.
Public/Granted literature
- US12130264B2 Hammering test system Public/Granted day:2024-10-29
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